The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Jul. 25, 2018
Applicant:

Hilti Aktiengesellschaft, Schaan, LI;

Inventors:

Sascha Korl, Buchs, CH;

Vinod Khare, Westminster, CO (US);

Yujia Zhang, Columbus, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01); G06T 3/00 (2006.01); G06T 7/80 (2017.01); G01C 11/02 (2006.01); G01B 11/25 (2006.01); H04N 5/247 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
H04N 9/3185 (2013.01); G01B 11/2513 (2013.01); G01C 11/025 (2013.01); G06T 3/005 (2013.01); H04N 5/247 (2013.01); H04N 9/317 (2013.01); H04N 9/3194 (2013.01); G06T 7/521 (2017.01); G06T 7/80 (2017.01); G06T 2207/20012 (2013.01); G06T 2207/30244 (2013.01); H04N 9/3161 (2013.01);
Abstract

A system and method for recalibrating a projector system. The system includes one or more cameras, a projector, and at least one processor. The at least one processor is configured to execute stored instructions to project one or more patterns on to a work surface via the projector, capture images of the projected one or more patterns via the one or more cameras, perform analysis on the captured images of the one or more patterns, determine projector calibration parameters based at least in part on the performed analysis on the captured images, and recalibrate the projector system such that an image is projected onto the work surface by the projector at a correct position based on the determined projector calibration parameters.


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