The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Dec. 26, 2019
Applicant:

National Chung-shan Institute of Science and Technology, Taoyuan, TW;

Inventors:

Yung-Han Huang, Taoyuan, TW;

Chung-Yen Lu, Taoyuan, TW;

Jian-Long Ruan, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/18 (2006.01); H01L 31/0336 (2006.01); H01L 31/0224 (2006.01); H01L 31/109 (2006.01); H01L 31/0368 (2006.01);
U.S. Cl.
CPC ...
H01L 31/18 (2013.01); H01L 31/022408 (2013.01); H01L 31/0336 (2013.01); H01L 31/0368 (2013.01); H01L 31/109 (2013.01);
Abstract

The present invention adopts an aluminum nitride substrate with great heat dissipation, great thermal conductivity, high electrical insulation, long service life, corrosion resistance, high temperature resistance, and stable physical characteristics. A high-quality zinc oxide film with a wide energy gap is fabricated on the aluminum nitride substrate by magnetron radio frequency (RF) sputtering. Compared with general vapor deposition, chemical vapor deposition and hydrothermal, the magnetron RF sputtering grows the high-quality zinc oxide film with few defects. The zinc oxide film with few defects concentration is an important key technology for short-wavelength optoelectronic devices, which decrease leakage currents of the optoelectronic devices, reduces flicker noise, and further improves its UV-visible rejection ratio.


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