The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Dec. 28, 2017
Applicant:

U.s. Army Research Laboratory Attn: Rdrl-loc-i, Adelphi, MD (US);

Inventor:

Kwong-Kit Choi, Brookeville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0232 (2014.01); H01L 31/0352 (2006.01); H01L 51/44 (2006.01); H01L 31/103 (2006.01); H01L 51/42 (2006.01); H01L 31/101 (2006.01); H01L 31/0296 (2006.01); H01L 31/032 (2006.01); H01L 27/144 (2006.01); H01L 31/0216 (2014.01); H01L 31/0304 (2006.01); G06F 30/20 (2020.01); G06F 30/23 (2020.01); G06F 30/39 (2020.01); H01L 31/0256 (2006.01); H01L 51/00 (2006.01);
U.S. Cl.
CPC ...
H01L 31/02327 (2013.01); G06F 30/20 (2020.01); G06F 30/23 (2020.01); G06F 30/39 (2020.01); H01L 27/1446 (2013.01); H01L 31/0296 (2013.01); H01L 31/02168 (2013.01); H01L 31/02966 (2013.01); H01L 31/0324 (2013.01); H01L 31/03046 (2013.01); H01L 31/035218 (2013.01); H01L 31/035236 (2013.01); H01L 31/035281 (2013.01); H01L 31/103 (2013.01); H01L 31/1013 (2013.01); H01L 31/1037 (2013.01); H01L 51/4213 (2013.01); H01L 51/44 (2013.01); H01L 51/447 (2013.01); H01L 31/0304 (2013.01); H01L 51/0046 (2013.01); H01L 51/426 (2013.01); H01L 2031/0344 (2013.01); Y02E 10/544 (2013.01); Y02E 10/549 (2013.01);
Abstract

A photo detection device comprising a contact layer through which light enters; an absorbing region positioned such that light admitted through the contact layer passes into the absorbing region; at least one diffractive element operatively associated with the absorbing region operating to diffract light into the absorbing region; the configuration of the at least one diffractive element being determined by computer simulation to determine an optimal diffractive element (or elements) and absorbing region configuration for optimal quantum efficiency for at least one predetermined wavelength detection range, the at least one diffractive element operating to diffract light entering through the contact layer such that phases of diffracted waves from locations within the photo detection device or waves reflected by sidewalls and waves reflected by the at least one diffractive element form a constructive interference pattern inside the absorbing region. A method of designing a photodetector comprises using a computer simulation to determine an optimal configuration for at least one wavelength range occurring when waves reflected by the diffractive element form a constructive interference pattern inside the absorbing region.


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