The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Sep. 14, 2018
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, CN;
Liyang An, Shenzhen, CN;
SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD., Guangdong, CN;
Abstract
The invention provides a COA type array substrate and a method for measuring via size on color-resist layer. The COA type array substrate is formed by designing a drain of the TFT comprising a drain body corresponding to a first via of the color-resist layer, and a first extending portion, a second extending portion and a third extending portion formed by outwardly protruding from edge of the drain body, able to improve the measurement accuracy of the size of the first via on the color-resist layer, thereby improving the production yield of the COA type array substrate.