The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Jul. 26, 2018
Applicant:
Micromass Uk Limited, Wilmslow, GB;
Inventors:
Anatoly Verenchikov, Bar, ME;
Mikhail Yavor, St. Petersburg, RU;
Assignee:
Micromass UK Limited, Wilmslow, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); H01J 49/22 (2006.01); H01J 49/00 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/406 (2013.01); H01J 49/0031 (2013.01); H01J 49/061 (2013.01); H01J 49/22 (2013.01);
Abstract
A multi-reflecting time-of-flight mass spectrometer MR TOF with an orthogonal accelerator () is improved with at least one deflector () and/or (R) in combination with at least one wedge field () for denser folding of ion rays (). Systematic mechanical misalignments () of ion mirrors () may be compensated by electrical tuning of the instrument, as shown by resolution improvements between simulated peaks for non compensated case () and compensated one (), and/or by an electronically controlled global electrostatic wedge/arc field within ion mirror ().