The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

May. 01, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Kiyomi Yoshinari, Tokyo, JP;

Yasushi Terui, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); H01J 49/02 (2006.01); H01J 49/24 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0431 (2013.01); H01J 49/022 (2013.01); H01J 49/025 (2013.01); H01J 49/0445 (2013.01); H01J 49/24 (2013.01);
Abstract

The mass spectrometer includes an ionization unit that ionizes a sample; a nozzle unit having an inflow port that is connected to the ionization unit by a flow pipe and through which the ionized sample flows, and an outflow port from which the sample flowing in flows out; a vacuum chamber that is evacuated by vacuum evacuation means and into which the sample flows from the nozzle unit; a mass analysis unit that is located downstream of a flow of the sample relative to the vacuum chamber and that selects ions from the sample; and an ion detection unit that detects the ions selected by the mass analysis unit, wherein a division portion that divides a flow of the sample is provided inside the nozzle unit, and the division portion has a tapered projection whose diameter decreases toward the outflow port.


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