The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Dec. 19, 2017
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Kevin Martin Brown, Chardon, OH (US);

Bernhard Johannes Brendel, Norderstedt, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06T 5/50 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 11/005 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20192 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30008 (2013.01); G06T 2211/424 (2013.01);
Abstract

A system () includes input/output configured to receive line integrals from a contrast enhanced spectral scan by an imaging system. The system further includes () a processor () configured to: decompose () the line integrals into at least Compton scatter and a photo-electric effect line integrals; reconstruct the Compton scatter and a photo-electric effect line integrals to generate spectral image data, including at least Compton scatter and photo-electric effect images; de-noise () the Compton scatter and photo-electric effect images; identify () residual iodine voxels in the de-noised Compton scatter and the photo-electric effect images corresponding to residual iodine artifact; and produce a virtual non-contrast image using the identified residual iodine voxels.


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