The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Apr. 26, 2017
Hitachi, Ltd., Tokyo, JP;
Peifei Zhu, Tokyo, JP;
Zisheng Li, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Volume data is used for extracting a contour of a measurement object and measurement information describing anatomical structure useful for diagnosis is acquired from the contour. When volume data of a subject is inputted (S), an image processing device detects feature points in the volume data (S); detects contours of a plurality of parts in the volume data based on the detected feature points and anatomical definitions (S); and optimizes boundary lines defining contours of parts contacting each other, out of the detected plural parts, so as to combine together the optimized contours of the plural parts for creating a contour of the measurement object (S). Measurements are taken on diagnostic items useful for diagnosis based on the created contour (S); and the acquired measurement information is outputted as measurement results (S) which are displayed at a display.