The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Aug. 22, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Chuanyong Bai, Solon, OH (US);
Andriy Andreyev, Willoughby Hills, OH (US);
Bin Zhang, Cleveland, OH (US);
Yang-Ming Zhu, Solon, OH (US);
Xiyun Song, Cupertino, CA (US);
Jinghan Ye, Livermore, CA (US);
Zhiqiang Hu, Twinsburg, OH (US);
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
Image processing performed by a computer () includes iterative image reconstruction or refinement () that produces a series of update images ending in an iteratively reconstructed or refined image. A difference image () is computed between a first update image () and a second update image () of the series. The difference image is converted to a feature image () and is used in the iterative processing () or in post-processing () performed on the iteratively reconstructed or refined images or images from different reconstruction or refinement techniques. In another embodiment, first and second image reconstructions () are performed to generate respective first and second reconstructed images (). A difference image () is computed between two images each selected from the group: the first reconstructed image, an update image of the first reconstruction, the second reconstructed image, and an update image of the second reconstruction. A feature image is generated from the difference image and used to combine the first and second reconstructed images.