The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Dec. 15, 2020
Applicant:

Beijing Sensetime Technology Development Co., Ltd., Beijing, CN;

Inventors:

Jiaqi Wang, Beijing, CN;

Kai Chen, Beijing, CN;

Rui Xu, Beijing, CN;

Ziwei Liu, Beijing, CN;

Chen Change Loy, Beijing, CN;

Dahua Lin, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06T 3/40 (2013.01); G06K 9/46 (2013.01); G06K 9/6232 (2013.01); G06K 9/6256 (2013.01); G06K 9/6262 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01);
Abstract

An example of the present disclosure provides methods, apparatuses and devices for magnifying a feature map, and a computer readable storage medium. The method includes: receiving a source feature map to be magnified; obtaining N reassembly kernels corresponding to each source position in the source feature map by performing convolution on the source feature map, wherein N refers to a square of a magnification factor of the source feature map; obtaining, for each of the reassembly kernels, a normalized reassembly kernel by performing normalization; obtaining, for each source position in the source feature map, N reassembly features corresponding to the source position by reassembling features of a reassembly region determined according to the source position with N normalized reassembly kernels corresponding to the source position; and generating a target feature map according to the N reassembly features corresponding to each source position in the source feature map.


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