The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

May. 31, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Qiyao Wang, Los Gatos, CA (US);

Haiyan Wang, Fremont, CA (US);

Susumu Serita, San Jose, CA (US);

Takashi Saeki, Sunnyvale, CA (US);

Chetan Gupta, San Mateo, CA (US);

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01); G06N 20/00 (2019.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/06393 (2013.01); G06N 20/00 (2019.01); H04L 67/12 (2013.01);
Abstract

Example implementations described herein involve systems and methods involving a plurality of sensors monitoring one or more processes, the sensors providing sensor data, which can include determining a probability map of the sensor data from a database and a functional relationship between key performance indicators (KPIs) of the one or more processes and the sensor data; executing a search on the probability map to determine constrained and continuous ranges for the sensor data that optimize KPIs for the one or more processes based on the functional relationship; and generating a recommendation for the one or more processes that fit within the constrained and continuous range of the sensor data.


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