The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Oct. 09, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Kanata Suzuki, Kawasaki, JP;

Toshio Endoh, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06K 9/62 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06K 9/628 (2013.01); G06K 9/6256 (2013.01); G06N 3/0454 (2013.01);
Abstract

A feature model, which calculates a feature value of an input image, is trained on a plurality of first images. First feature values corresponding one-to-one with the first images are calculated using the feature model, and feature distribution information representing a relationship between a plurality of classes and the first feature values is generated. When a detection model which determines, in an input image, each region with an object and a class to which the object belongs is trained on a plurality of second images, second feature values corresponding to regions determined within the second images by the detection model are calculated using the feature model, an evaluation value, which indicates class determination accuracy of the detection model, is modified using the feature distribution information and the second feature values, and the detection model is updated based on the modified evaluation value.


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