The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Sep. 10, 2018
Ciena Corporation, Hanover, MD (US);
Thomas Triplet, Manotick, CA;
David Côté, Gatineau, CA;
Merlin Davies, Montreal, CA;
Arslan Shahid, Ottawa, CA;
Kevin Kim, Montreal, CA;
Yan Liu, Montreal, CA;
Ciena Corporation, Hanover, MD (US);
Abstract
Systems and methods of automated feature selection and pattern discovery of multi-variate time-series include obtaining a multi-variate times-series from a network; preprocessing the multi-variate times-series to account for sampling intervals and missing data in the multi-variate times-series; determining a distance matrix for the multi-variate times-series which estimates correlation among features in the multi-variate times-series; performing clustering on the distance matrix; reducing dimensionality of the multi-variate times-series based on the clustering to provide a lower-dimensionality time-series; and providing the lower-dimensionality time-series to one or more applications configured to analyze the multi-variate times-series from the network, wherein the lower-dimensionality time-series provides similar information as the multi-variate time-series with fewer dimensions thereby improving computational complexity of the one or more applications.