The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Mar. 11, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Steven Partlow, Beacon, NY (US);

Joseph Griesemer, Poughkeepsie, NY (US);

Robert Miller, Jr., Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3692 (2013.01);
Abstract

Examples of techniques for environment modification for software application testing are described herein. An aspect includes, based on starting testing of an application under test using a test case in a testing environment and determining that modification of the testing environment is enabled, modifying the testing environment. Another aspect includes running the testing of the application under test using the test case in the modified testing environment. Another aspect includes, based on detection of an error during the testing of the application under test, determining whether the error was caused by the modified testing environment. Another aspect includes, based on determining that the error was caused by the modified testing environment, suppressing the error and continuing the testing of the application under test in the modified testing environment. Another aspect includes, based on determining that the error was not caused by the modified testing environment, percolating the error.


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