The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Oct. 30, 2017
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Joseph Kurth Reynolds, Mountain View, CA (US);

Phillip Acker, San Mateo, CA (US);

Kirk Hargreaves, Sunnyvale, CA (US);

Shahrooz Shahparnia, Campbell, CA (US);

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); G06F 3/044 (2006.01); H03K 17/955 (2006.01); H03K 17/96 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0446 (2019.05); G01R 27/2605 (2013.01); G06F 3/04166 (2019.05); G06F 3/041662 (2019.05); H03K 17/955 (2013.01); H03K 17/9622 (2013.01); G06F 3/0445 (2019.05); H03K 2217/96073 (2013.01); H03K 2217/960725 (2013.01); H03K 2217/960765 (2013.01); H04M 2250/12 (2013.01);
Abstract

A capacitive sensor device comprises a first sensor electrode, a second sensor electrode, and a processing system coupled to the first sensor electrode and the second sensor electrode. The processing system is configured to acquire a first capacitive measurement by emitting and receiving a first electrical signal with the first sensor electrode. The processing system is configured to acquire a second capacitive measurement by emitting and receiving a second electrical signal, wherein one of the first and second sensor electrodes performs the emitting and the other of the first and second sensor electrodes performs the receiving, and wherein the first and second capacitive measurements are non-degenerate. The processing system is configured to determine positional information using the first and second capacitive measurements.


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