The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Jun. 30, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Nao Saito, Tokyo, JP;

Kenta Kirihara, Tokyo, JP;

Masahiro Yatsu, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G05B 23/02 (2006.01); G06F 16/00 (2019.01); G06F 16/17 (2019.01); G06Q 50/06 (2012.01);
U.S. Cl.
CPC ...
G05B 23/024 (2013.01); G05B 23/0221 (2013.01); G05B 23/0235 (2013.01); G06F 16/00 (2019.01); G06F 16/1734 (2019.01); G06Q 50/06 (2013.01);
Abstract

A manipulation candidate classification unit provided in this operation assistance device classifies manipulation logs associated with a plurality of events stored in a past case database, as manipulation candidates, on the basis of measured value feature quantity tolerance ranges, and groups the classified manipulation candidates and the measured value feature quantity tolerance ranges together to create manipulation candidate groups. A manipulation candidate search unit searches a manipulation candidate database for a manipulation candidate group associated with a feature quantity that is associated with a past event and that is close to a feature quantity associated with a new event, and outputs the found manipulation candidate group to an output unit.


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