The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Mar. 22, 2019
Fanuc Corporation, Tamanashi, JP;
Ricoh Company, Ltd., Tokyo, JP;
Tetsushi Takahara, Yamanashi, JP;
Yasuhiro Nakahama, Yamanashi, JP;
Shinji Okuda, Yamanashi, JP;
Junichi Takami, Tokyo, JP;
FANUC CORPORATION, Yamanashi, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
Provided is an abnormality detection device with which an abnormality of a machining state of a machine tool can be detected based on information on a section where machining is actually performed in machine tool-based machining. The abnormality detection device detects an abnormality of a machining state of a machine tool machining a workpiece with a tool. The machine tool includes a determination unit determining the machining state by using information related to an actual cutting section in the tool-based machining of the workpiece in the machine tool. The determination unit performs the machining state determination by using a deviation in position and length of a section recognized as the actual cutting section and a physical quantity in the actual cutting section acquired from the machine tool.