The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Aug. 02, 2017
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Florian Fahrbach, Mannheim, DE;
Werner Knebel, Kronau, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A light sheet microscope or a confocal microscope includes illumination optics configured to transmit light of at least two wavelengths from at least one light source, along respective wavelength-dependent beam paths, from an illumination side of the illumination optics to a specimen side of the illumination optics. A lateral chromatic correction system comprising at least one optical lateral chromatic correction element is configured such that the beam paths of the at least two different wavelengths have, at a specimen-side output of the lateral chromatic correction element, an offset parallel to each other and/or are inclined relative to each other in relation to the illumination side, which, on the specimen side of the illumination optics, results in an offset of the foci of the at least two wavelengths transverse to an optical axis of the illumination optics.