The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Apr. 28, 2017
Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, CN;
Shiyong Shao, Hefei, CN;
Yong Han, Hefei, CN;
Zongbo Shi, Hefei, CN;
Daming Yu, Hefei, CN;
Wenyue Zhu, Hefei, CN;
Xuebin Li, Hefei, CN;
Abstract
The present invention discloses a method of simultaneously acquiring vertical profiles of multiple atmospheric parameters. Measuring devices based on multiple principles and capable of measuring multiple parameters simultaneously are fixed on a cable of an aerostat at specified distance decided by measurement task, each measuring device finishes measuring the atmospheric parameters at its altitude thereof, and transmits data to a ground data acquisition and processing device in real time, so as to synchronously acquire the real-time measured profiles of multiple atmospheric parameters. The profile data does not have any assumption, and standard data can be provided to a ground remote sensing device like radar for measuring at the same place while regular meteorological parameters and atmospheric contamination data are provided to atmospheric and environmental governance departments.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile