The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Oct. 23, 2018
University of Cincinnati, Cincinnati, OH (US);
Jinghua Wang, Mason, OH (US);
UNIVERSITY OF CINCINNATI, Cincinnati, OH (US);
Abstract
A method and system for improving the quality of MR images acquired with optimal variable flip angles includes receiving MRI parameters for a target tissue, selecting at least one objective function from a plurality of objective functions, simulating a relationship between each flip angle and the at least one objective functions based on the MRI parameters, determining optimal variable flip angle distribution to reach optimization of the at least one objective function for whole acquisition of the MR image, selecting or optimizing a k-space strategy, applying a plurality of radio frequency (RF) pulses with the optimal variable flip angle distribution and the k-space strategy to a target area in an object, receiving MR signals from the target area, the MR signals corresponding to the plurality of RF pulses, acquiring, in the k-space strategy, k-space lines based on the MR signals, and reconstructing the MR image from the k-space lines.