The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Dec. 14, 2017
Applicant:

Melexis Technologies SA, Bevaix, CH;

Inventors:

Jan-Willem Burssens, Bevaix, CH;

Vincent Hiligsmann, Bevaix, CH;

Lucian Barbut, Bevaix, CH;

Samuel Huber Lindenberger, Bevaix, CH;

Christian Schott, Bevaix, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01R 33/00 (2006.01); G01R 33/07 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0005 (2013.01); G01R 33/007 (2013.01); G01R 33/0047 (2013.01); G01R 33/07 (2013.01); G01R 33/09 (2013.01);
Abstract

An apparatus and a method for redundant measurements of a magnetic field originating from or influenced by a moveable object is described. The apparatus comprising at least one first magnetic field sensitive element measuring at least one magnetic field property of the magnetic field, wherein the at least one first magnetic field sensitive element is implemented on a first area of a semiconductor substrate, at least one second magnetic field sensitive element measuring at least one magnetic field property of the magnetic field, wherein the at least one second magnetic field sensitive element is implemented on a second area of said semiconductor substrate, and wherein the first and second areas are isolated from one another.


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