The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Apr. 26, 2019
Applicant:

Wuhan China Star Optoelectronics Technology Co., Ltd., Wuhan, CN;

Inventors:

Xin Zhang, Wuhan, CN;

Jingfeng Xue, Wuhan, CN;

Siwen Miao, Wuhan, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G02F 1/1345 (2006.01); G02F 1/1362 (2006.01); G02F 1/1368 (2006.01); G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2825 (2013.01); G02F 1/1309 (2013.01); G02F 1/1368 (2013.01); G02F 1/13458 (2013.01); G02F 1/136254 (2021.01); G02F 2203/69 (2013.01);
Abstract

A display panel and a method for testing for an occurrence of a crack in a display panel are provided. The display panel includes a panel body, a ground line, a first ground connecting portion, a first testing portion, a second ground connecting portion, a second testing portion, and a switch. By measuring a voltage, a resistance, or a current between the first testing portion and the second testing portion, an open circuit in the ground line and a crack in a non-display area can be detected. Therefore, difficulty of confirming if a crack occurs in the display panel is reduced.


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