The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Aug. 13, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Adrian Ispas, Munich, DE;
Julian Leyh, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A signal analysis method for determining at least one perturbance component of an input signal is described, wherein the perturbance is associated with at least one of jitter and noise. The signal analysis method includes: receiving and/or generating probability data containing information on a collective probability density function of a random perturbance component of the input signal and an other bounded uncorrelated (OBU) perturbance component of the input signal; determining a standard deviation of the random perturbance component based on the probability data; determining a random perturbance probability density function being associated with the random perturbance component based on the standard deviation; and determining an OBU perturbance probability density function being associated with the OBU perturbance component, wherein the OBU perturbance probability density function is determined based on the probability data and based on the probability density function that is associated with the random perturbance component. Further, a measurement instrument is described.