The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Jan. 15, 2019
Blutest Ab, Göteborg, SE;
Bluetest AB, Göteborg, SE;
Abstract
A method and apparatus for production testing of a device under test (DUT) in a chamber is disclosed, the chamber defining an internal cavity therein, adapted to enclose the DUT, and including walls having inwardly facing surfaces of an electromagnetically reflective material, thereby supporting several resonant modes within the internal cavity. The method comprises: arranging the DUT at one or several measurement position(s) in the internal cavity; measuring radio frequency transmission between the DUT and at least one chamber antenna arranged in the internal cavity sequentially in a number of different static mode distribution configurations; comparing the measured radio frequency transmission at said predetermined mode distribution configurations with reference values obtained from measurement of a reference device arranged at the same measurement position(s) within the internal cavity, and at the same static mode distribution configurations; and determining whether the DUT is acceptable or non-acceptable based on said comparing.