The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Jul. 19, 2017
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Joson K. Joseph, Bear, DE (US);

Bestin Abraham, Newark, DE (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 21/13 (2006.01); G01N 35/02 (2006.01); B01L 9/06 (2006.01); G01N 21/25 (2006.01); B01L 3/00 (2006.01); G01N 35/04 (2006.01); A61B 5/1455 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00712 (2013.01); B01L 3/5085 (2013.01); B01L 9/06 (2013.01); G01N 21/13 (2013.01); G01N 21/253 (2013.01); G01N 35/00663 (2013.01); G01N 35/025 (2013.01); G01N 35/04 (2013.01); A61B 5/14557 (2013.01); B01L 2200/028 (2013.01); B01L 2300/0803 (2013.01); G01N 2035/0444 (2013.01); G01N 2201/025 (2013.01); G01N 2201/0415 (2013.01);
Abstract

A computer-implemented method for performing photometric cuvette mapping includes detecting edges associated with a plurality of gaps between a plurality of vessels in a reaction ring during a complete rotation of a reaction ring. Each gap is determined according to an edge detection process which includes identifying: a vessel interior in response to detection of a first predetermined number of photometer device control manager (DCM) measurements below a threshold value; a rising edge in response to detection of a second predetermined number of photometer DCM measurements above the threshold value; and identifying a falling edge in response to detection of a third predetermined number of photometer DCM measurements below the threshold value. The edge detection process further includes recording the rising edge and the falling edge as being indicative of one of the plurality of gaps.


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