The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Oct. 24, 2017
Applicant:

Safran, Paris, FR;

Inventors:

Mathieu Loïc Ducousso, Moissy-Cramayel, FR;

Nicolas Cuvillier, Moissy-Cramayel, FR;

Assignee:

SAFRAN, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/30 (2006.01); G01N 29/44 (2006.01); G01N 29/52 (2006.01); G01N 29/46 (2006.01); G01N 29/26 (2006.01);
U.S. Cl.
CPC ...
G01N 29/041 (2013.01); G01N 29/262 (2013.01); G01N 29/30 (2013.01); G01N 29/4409 (2013.01); G01N 29/4472 (2013.01); G01N 29/46 (2013.01); G01N 29/52 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/02854 (2013.01); G01N 2291/0427 (2013.01); G01N 2291/106 (2013.01); G01N 2291/2632 (2013.01); G01N 2291/2694 (2013.01);
Abstract

A method for nondestructive inspection by ultrasound of a bonded assembly is provided. The method comprises two steps, consisting of measuring a thickness of an adhesive joint of the bonded assembly by an ultrasound transducer arranged on the bonded assembly in a determined position, and measuring the degree of adhesion of parts of the bonded assembly by the same ultrasound transducer maintained in the determined position, the degree of adhesion being measured by ZGV Lamb waves.


Find Patent Forward Citations

Ducousso, Mathieu Loïc. (2021). Method for nondestructive inspection by ultrasound of a bonded assembly (U.S. Patent No. 11047829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11047829

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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