The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2021

Filed:

Jan. 18, 2017
Applicant:

King Abdullah University of Science and Technology, Thuwal, SA;

Inventors:

Rami Tarek El Afandy, Thuwal, SA;

Boon Siew Ooi, Thuwal, SA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/18 (2006.01); G01K 11/00 (2006.01); G01N 33/483 (2006.01); G01K 17/00 (2006.01); G01N 33/50 (2006.01); G01N 21/62 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 25/18 (2013.01); G01K 11/00 (2013.01); G01K 17/006 (2013.01); G01N 21/62 (2013.01); G01N 21/64 (2013.01); G01N 33/4833 (2013.01); G01N 33/5005 (2013.01); G01N 21/6489 (2013.01);
Abstract

A method for measuring thermal diffusivity/conductivity of a microscale sample includes placing a metallic disk atop the sample, and disposing a nanomembrane over the sample and over the metallic disk so that the nanomembrane, so that the metallic disk, the nanomembrane and the sample are in thermal equilibrium with one another. A laser beam is directed to fall onto the nanomembrane over the sample, while a radiation sensor is operated to detect photoluminescent radiation emitted by the nanomembrane in response to the laser beam. A spectral shift in the detected photoluminescent radiation emitted by the nanomembrane is determined, and thermal diffusivity/conductivity is calculated from the determined spectral shift of the photoluminescence.


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