The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Mar. 07, 2019
New York University, New York, NY (US);
Nektarios Georgios Tsoutsos, Athens, GR;
Nikhil Gupta, Ossining, NY (US);
Michail Maniatakos, Abu Dhabi, AE;
NEW YORK UNIVERSITY, New York, NY (US);
Abstract
A system for detecting corruption in a three-dimensional model for use in additive manufacturing comprises a non-transitory computer-readable medium with instructions stored thereon, that when executed by a processor, perform the steps of obtaining a set of tool-control language instructions that define an additive manufactured part, obtaining a first mechanical specification for the additive manufactured part, constructing a virtual three dimensional model from the set of tool-control language instructions, performing at least one analysis step on the virtual three dimensional model to determine whether the virtual three dimensional model meets the first mechanical, electrical, thermal, and/or magnetic specification, and indicating that the set of tool-control language instructions is corrupt when the virtual three dimensional model fails to meet the first mechanical, electrical, thermal, and/or magnetic specification. A method of producing an additive manufactured part is also described.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile