The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2021
Filed:
Feb. 08, 2019
Applicant:
Monsanto Technology Llc, St. Louis, MO (US);
Inventors:
Johnny J. Kotyk, Manchester, MO (US);
Hsin-Chen Chen, Manchester, MO (US);
Assignee:
Monsanto Technology LLC, St. Louis, MO (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A01C 1/04 (2006.01); B07C 5/342 (2006.01); A01C 1/02 (2006.01); G06K 9/00 (2006.01); G06N 20/00 (2019.01); G06K 9/66 (2006.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
A01C 1/04 (2013.01); A01C 1/02 (2013.01); B07C 5/3425 (2013.01); G06K 9/00147 (2013.01); G06K 9/626 (2013.01); G06K 9/66 (2013.01); G06N 20/00 (2019.01); G06T 7/0014 (2013.01); B07C 2501/009 (2013.01); G06T 2207/10116 (2013.01);
Abstract
A method of analyzing seeds including acquiring, using an X-ray machine, X-ray images of the seeds. Analyzing the X-ray images to determine a parameter of each of the seeds. Comparing a parameter determined from analyzing the X-ray image of one seed to a parameter determined from analyzing the X-ray image of another seed. Arranging the seeds relative to each other based on the seed parameters.