The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Mar. 12, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Shin Tezuka, Tokyo, JP;

Tomoya Oota, Tokyo, JP;

Yuji Kakutani, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); H04L 29/08 (2006.01); H04L 12/24 (2006.01); G08B 21/18 (2006.01); H04N 19/96 (2014.01); H04N 19/176 (2014.01); H04N 19/157 (2014.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
H04L 67/12 (2013.01); G08B 21/187 (2013.01); H04L 41/0816 (2013.01); G01M 99/005 (2013.01);
Abstract

An equipment analysis support apparatus includes an equipment constraint information storage unit that stores equipment constraint information which is a correspondence relationship between each process constituting work performed using a plurality of pieces of equipment and a constraint to be imposed on the equipment in each process; a work process information acquisition unit that acquires work process information which is information on a process of the work currently in progress; a configuration information generation unit that, when it is determined that a current work state is changed, specifies a constraint to be imposed on the equipment in the changed work state and generates a configuration of analysis processing of the equipment satisfying the specified constraint based on the acquired work process information and the equipment constraint information; and a processing execution unit that performs processing necessary for analysis of the equipment based on the generated configuration.


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