The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

May. 16, 2018
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Hiroshi Endo, Atsugi, JP;

Shigeto Suzuki, Kawasaki, JP;

Hiroyoshi Kodama, Isehara, JP;

Hiroyuki Fukuda, Yokohama, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/045 (2013.01); H04L 41/14 (2013.01); H04L 41/145 (2013.01); H04L 41/147 (2013.01);
Abstract

A data center management method executed by a computer that includes a first memory and a second memory, the method includes storing, in the second memory, a predicted value calculated based on measured values obtained as measurement data and differences each corresponding to the measurement data obtained a predetermined period ago; storing, in the first memory, the measurement data as the measured value; calculating, based on each of the stored measured values, an amount of change which is a difference between the measured value and the predicted value, and storing the calculated amount in the second memory; calculating first corrected prediction data based on the measured value currently measured and the measurement values previously measured; calculating second corrected prediction data based on previous amounts of change and the first corrected prediction data; and controlling the device using an operation amount calculated based on the second corrected prediction data.


Find Patent Forward Citations

Loading…