The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

May. 20, 2019
Applicant:

Vanguard International Semiconductor Corporation, Hsinchu, TW;

Inventors:

Yu-Chieh Chou, New Taipei, TW;

Hsin-Chih Lin, Hsinchu, TW;

Chang-Xiang Hung, Chiayi County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/205 (2006.01); H01L 29/778 (2006.01); H01L 29/20 (2006.01); H01L 29/66 (2006.01); H01L 29/40 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7786 (2013.01); H01L 29/2003 (2013.01); H01L 29/205 (2013.01); H01L 29/404 (2013.01); H01L 29/66462 (2013.01);
Abstract

A semiconductor structure includes a substrate, a gate electrode, a first dielectric layer, a gate metal layer, a source structure, and a drain structure. The first dielectric layer has a first opening exposing the gate electrode and a second opening, and the depth of the second opening is greater than the depth of the first opening. The gate metal layer conformally covers the top surface of the first dielectric layer, the first opening, and the second opening to serve as a gate field plate. A first portion of the gate metal layer at the bottom of the first opening is higher than a second portion of the gate metal layer at the bottom of the second opening. The source structure and the drain structure are disposed at opposite sides of the gate structure, wherein the second opening is disposed between the gate electrode and the drain structure.


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