The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Jul. 05, 2018
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Hitoshi Ohkubo, Tokyo, JP;

Masazumi Arata, Tokyo, JP;

Takahiro Kawahara, Tokyo, JP;

Hokuto Eda, Tokyo, JP;

Hiroki Tsujiai, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01F 27/28 (2006.01); H01F 27/32 (2006.01); H01F 41/04 (2006.01); H01F 27/29 (2006.01); H01F 17/04 (2006.01); H01F 17/00 (2006.01); H05K 1/16 (2006.01); H05K 1/18 (2006.01);
U.S. Cl.
CPC ...
H01F 27/324 (2013.01); H01F 17/0013 (2013.01); H01F 17/04 (2013.01); H01F 27/2804 (2013.01); H01F 27/292 (2013.01); H01F 41/04 (2013.01); H01F 2017/0066 (2013.01); H01F 2017/0073 (2013.01); H01F 2017/048 (2013.01); H05K 1/165 (2013.01); H05K 1/181 (2013.01); H05K 2201/1003 (2013.01); H05K 2201/10636 (2013.01);
Abstract

In a planar coil element, a dead space in a non-overlapping region is reduced by designing a total width of a first resin wall and a first turn located in the non-overlapping region to be narrow, more specifically, by designing the total width to be narrower than a total width of a second turn outside the first turn and a second resin wall located inside the turn and also than a total width of a third turn on the outer side and a third resin wall located inside the turn. As a result, a volume of a magnetic element body in a magnetic core portion of a coil can be increased, and an, inductance value, which is a magnetic characteristic, can also be improved.


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