The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Jul. 14, 2017
Applicant:

Abbyy Process Intelligence Inc., Springfield, PA (US);

Inventors:

Scott Opitz, Media, PA (US);

Alex Elkin, Acton, MA (US);

Assignee:

ABBYY DEVELOPMENT INC., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 40/20 (2018.01); G06N 5/02 (2006.01); G06F 16/35 (2019.01); G06F 16/26 (2019.01); G06F 16/2458 (2019.01); G16H 10/60 (2018.01); G06F 40/56 (2020.01); G16H 10/20 (2018.01); G06N 20/00 (2019.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G16H 40/20 (2018.01); G06F 16/2474 (2019.01); G06F 16/26 (2019.01); G06F 16/358 (2019.01); G06F 40/56 (2020.01); G06N 5/025 (2013.01); G16H 10/60 (2018.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01); G16H 10/20 (2018.01);
Abstract

Techniques are disclosed for creating event sequences from event data and then providing a visual analysis of event sequences. An event sequencing application analyzes event-related data in order to group events in accordance with predetermined grouping criteria and to sort the events in a chronological order to generate the event sequences. The event sequencing application further provides calculated sequence-specific metrics and a visual representation of event sequences for an event set, thus allowing a user to sort, filter, query, and perform various other types of analysis over the event sequences.


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