The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
May. 28, 2019
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Andrew C. Wantuch, Albuquerque, NM (US);
Kyle Saxberg, Mountain View, CA (US);
Edward Steven Jimenez, Jr., Albuquerque, NM (US);
Jaxon Gittinger, Albuquerque, NM (US);
Srivathsan Koundinyan, Highland Park, NJ (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
Illustrative embodiments are directed to a method and apparatus for evaluating boundary detection in an image. A processed image is received, wherein a detected boundary of an image of an object is identified in the processed image. A Radon transform is applied to the processed image for a plurality of angles to form a processed image histogram corresponding to the detected boundary for each of the plurality of angles. The processed image histogram for each of the plurality of angles and a corresponding ground truth histogram for each of the plurality of angles is normalized to provide a normalized processed image histogram and a normalized ground truth histogram for each of the plurality of angles, wherein the ground truth histogram corresponds to a ground truth boundary of the object for a corresponding angle. An indication of the edges of the normalized processed image histogram for each of the plurality of angles is plotted to form a boundary detection evaluation visualization.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile