The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Mar. 20, 2019
Qualcomm Incorporated, San Diego, CA (US);
Albrecht Johannes Lindner, La Jolla, CA (US);
Volodimir Slobodyanyuk, San Diego, CA (US);
Stephen Michael Verrall, Carlsbad, CA (US);
Kalin Mitkov Atanassov, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
A method and electronic device for selectively obtaining depth information at locations within a scene are described. Image content analysis is performed on a received image of the scene. Locations within the image to obtain depth information within the scene are determined based on the image analysis. The locations are provided to a LIDAR (light+radar) unit to selectively obtain depth information at the scene locations. The depth information is received from the LIDAR unit and a second image analysis is performed on a second image. The second image analysis is based on the image content of the second image and the received depth information. Updated locations based on the second image analysis may be provided to the LIDAR unit to obtain updated depth information.