The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Nov. 01, 2019
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Scott E. Joyce, Foxboro, MA (US);
Dan Yuan, Hopkinton, MA (US);
Yingying Wang Martin, Southborough, MA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques are provided to implement intelligent test case management for system integration testing in a continuous development and integration environment. For example, a system integration testing (SIT) tool obtains feature information regarding features within a feature space of a computing system and an operational status of the features. The SIT tool obtains a plurality of test cases associated with a given feature of the computing system, wherein each test case is mapped to a set of one or more features within the feature space, which are utilized by the test case to execute a test procedure to test the given feature. The SIT tool selects each test case among the plurality of test cases, which is mapped to features that have an active operational status. The SIT tool executes the selected test cases to test the given feature.