The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Nov. 20, 2018
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Rachit Jain, Bothell, WA (US);

Rohit Raj, Seatle, WA (US);

Ian Leung, Seatle, WA (US);

Harshad Vasant Kulkarni, Bellevue, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 11/1471 (2013.01); G06F 11/1451 (2013.01); G06F 11/1469 (2013.01); G06F 16/2358 (2019.01); G06F 2201/80 (2013.01);
Abstract

Restoring data to a data store that suffered corrupted data over a time period is disclosed. A system may provide an interface to specify a time window and filter conditions for identifying corrupted data in an object in a data store, such as, but not limited to, a corrupted NoSQL table. Corrupted data is identified by applying the filter conditions to change logs for the data object (e.g., the No SQL table) in the data store. Repair operations are determined for individual items identified via the filter conditions. Identified corrupted data for items may be corrected, from change logs or backup data in some instances (e.g., data may be deleted, or updated or replaced with data from a backup of the data store when necessary).


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