The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
May. 02, 2019
Kodak Alaris Inc., Rochester, NY (US);
Bruce A. Link, Rochester, NY (US);
Robert W. Johnson, Rochester, NY (US);
Jose Zvietcovich Zegarra, Rochester, NY (US);
Peter O. Stubler, Rochester, NY (US);
Mark Barton, Rochester, NY (US);
Frank R. Brockler, Rochester, NY (US);
Michael S. Axman, Rochester, NY (US);
Madirakshi Das, Rochester, NY (US);
Gabor J. Ferencz, Jr., Rochester, NY (US);
Erik Garcell, Rochester, NY (US);
KODAK ALARIS INC., Rochester, NY (US);
Abstract
A system and method for performing real-time quality inspection of objects is disclosed. The system and method include a transport to move objects being inspected, allowing the inspection to be performed in-line. At least one optical acquisition unit is provided that captured optical images of the objects being inspected. The captured optical images are matched to CAD models of objects, and the matched CAD model is extracted. A laser with an illumination light beam has a wavelength in the violet or ultraviolet range then conducts scans of the objects, which are formed into three-dimensional point clouds. The point clouds are compared to the extracted CAD models for each object, where CTF are compared to user input or CAD model information and the object is determined to be acceptable or defective based on the extent of deviation between the point cloud and the CAD model.