The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Aug. 23, 2019
Mentor Graphics Corporation, Wilsonville, OR (US);
Yu Huang, West Linn, OR (US);
Szczepan Urban, Gowarzewo, PL;
Wu-Tung Cheng, Lake Oswego, OR (US);
Manish Sharma, Wilsonville, OR (US);
Siemens Industry Software Inc., Plano, TX (US);
Abstract
A system and method for performing scan chain testing is disclosed. Scan cells, in the form of scan chains, are inserted into circuit designs for testing those circuit designs. The integrity of the scan chains is checked for defects before testing the circuit under test. In order to do so, various scan chain patterns, including one or both of U-turn and Z-turn patterns, are used in order to generate scan chain test data. The scan chain test data is analyzed in order to identify one or both of a type of defect (e.g., a timing fault, stuck-at fault, etc.) or a location of the defect. Further, the scan chain testing is performed using chain patterns with adaptive length.