The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Jan. 30, 2017
Hitachi High-tech Corporation, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
The present invention provides an automatic analysis device and an automatic specimen processing system having a component-rack supply mechanism that, in a state where a plurality of component racks each having a disposable component mounted thereon are stacked, separates only a component rack at the leading stage of the stack from the other component racks, and supplies the separated component rack to the automatic analysis device or the automatic specimen processing system. Specifically, the automatic analysis device and the automatic specimen processing system have a supply mechanism including a separation mechanism that, in a state where a plurality of component racks are stacked, separates only a component rack at the leading stage of the stack from the other component racks, where the separation mechanism includes a movable mechanism having a pair of downward-movement prevention members that can separate the leading stage from the second stage of the stacked component racks; and a correction mechanism having a pair of correction members that correct a positional deviation of the component racks in order to avoid an influence of the positional deviation of the stacked component racks.