The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Jan. 10, 2012
Applicants:

Takeshi Matsuya, Tokyo, JP;

Yoshikazu Okamura, Tokyo, JP;

Ralf Thomae, Gauting, DE;

Eberhard Spanuth, Heidelberg, DE;

Boris Ivandic, Munich, DE;

Kamon Shirakawa, Tokyo, JP;

Shigeatsu Endo, Iwate, JP;

Inventors:

Takeshi Matsuya, Tokyo, JP;

Yoshikazu Okamura, Tokyo, JP;

Ralf Thomae, Gauting, DE;

Eberhard Spanuth, Heidelberg, DE;

Boris Ivandic, Munich, DE;

Kamon Shirakawa, Tokyo, JP;

Shigeatsu Endo, Iwate, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
G01N 33/6893 (2013.01); G01N 2333/70596 (2013.01); G01N 2800/26 (2013.01); G01N 2800/52 (2013.01);
Abstract

Disclosed is a prediction method for the prognosis of sepsis comprising measuring an sCD14-ST level in a sample. sCD14-ST, to be measured in the present invention, is a marker superior to procalcitonin, known as a marker to predict the prognosis in sepsis patients.


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