The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Aug. 21, 2018
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Kai Hebestreit, Heidelberg, DE;
Sylvia Saecker, Mannheim, DE;
Klaus Thome, St. Leon-Rot, DE;
Andreas Weller, Heidelberg, DE;
Robert Knapstein, Heidelberg, DE;
Werner Heidt, Darmstadt, DE;
Stefan Lieder, Mannheim, DE;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Abstract
A test element analysis system for the analytical examination of a sample is disclosed. The test element analysis system comprises: at least one evaluation device with at least one test element holder for positioning a test element containing the sample and at least one measuring device for measuring a change in a measuring zone of the test element, the change being characteristic for the analyte; at least one electrical heating element configured for electrically heating the test element; at least one electrical power supply for supplying electrical energy to the electrical heating element; at least one temperature sensor connected to the test element holder for detecting a temperature of the test element holder; at least one gap detection device configured for monitoring the electrical energy Esupplied by the electrical power supply to the electrical heating element for reaching a predetermined target temperature measured by the temperature sensor.