The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Mar. 20, 2015
Applicant:

Magnasense Technologies Oy, Vantaa, FI;

Inventor:

Markus Savonen, Rajamäki, FI;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/74 (2006.01); B03C 1/033 (2006.01); G01R 33/02 (2006.01); B03C 1/28 (2006.01); G01N 27/02 (2006.01); G01R 33/12 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/745 (2013.01); B03C 1/0335 (2013.01); B03C 1/288 (2013.01); G01N 27/023 (2013.01); G01R 33/0213 (2013.01); G01R 33/1276 (2013.01); B03C 2201/18 (2013.01); G01N 35/0098 (2013.01);
Abstract

The invention relates to a measuring arrangement comprising: a coil arrangement for creating a magnetic field to measure a sample to be arranged in connection with it including at least one flat coil, the coil geometry of which is arranged to be changed in the direction of the plane defined by the coil arrangement, in order to create a spatially changing magnetic field having a known distance dependence for measuring the sample; and electronics connected to the coil arrangement for creating a magnetic field using the coil arrangement; and means for changing the position of the sample and the coil arrangement relative to each other in order to change the magnetic field affecting the sample and having the known distance dependence. In addition, the invention also relates to a method for measuring a sample.


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