The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Apr. 12, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Oki Gunawan, Westwood, NJ (US);

Wang Zhou, White Plains, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01R 33/07 (2006.01); G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01N 27/72 (2013.01); G01R 33/032 (2013.01); G01R 33/07 (2013.01);
Abstract

Systems and methods are provided that facilitate high-sensitivity, carrier-resolved photo-Hall effect measurements. Majority and minority carrier properties can be measured and determined simultaneously. In one aspect, a system and method determine majority carrier type, density and mobility and, with modulated illumination, minority carrier mobility and photocarrier density. In another aspect, a system and method can determine hole and electron mobility, photocarrier density, absorbed photon density, recombination lifetime and diffusion length for hole, electron and ambipolar transport.


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