The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

May. 23, 2019
Applicant:

Lapis Semiconductor Co., Ltd., Kanagawa, JP;

Inventors:

Kenichiro Kusano, Miyagi, JP;

Atsuhiko Okada, Kanagawa, JP;

Hiroaki Sano, Kanagawa, JP;

Masao Okihara, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/414 (2006.01);
U.S. Cl.
CPC ...
G01N 27/414 (2013.01);
Abstract

A measurement device including: an ion-sensitive element; a reference electrode disposed in a state in which a measurement subject is interposed between the reference electrode and the ion-sensitive element; and a controller configured to: establish a first state at a predetermined interval, the first state being a state in which a current flows at the ion-sensitive element, and establish a second state within each period after the first state has been established and before the first state is next established, the second state being a state in which a potential difference between the ion-sensitive element and the reference electrode is greater than a potential difference between the ion-sensitive element and the reference electrode in the first state.


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