The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Jun. 17, 2020
Applicant:

Berthold Technologies Gmbh & Co. KG, Bad Wildbad, DE;

Inventors:

Joerg Baeuerle, Baiersbronn, DE;

Rachid El Korch, Schoemberg, DE;

Steffen Mueller, Pforzheim, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 22/04 (2006.01);
U.S. Cl.
CPC ...
G01N 22/04 (2013.01);
Abstract

A microwave-based measuring device includes a number n of sensors, each sensor of the number n of sensors being embodied to generate associated sensor data such that, overall, a number n of items of sensor data are generated by way of the number n of sensors. A measurement variable calculation unit is embodied to calculate a number m of measurement variable values depending on the number n of items of sensor data on the basis of values of a number d of parameters. A learning unit is embodied to calculate the values of the number d of parameters on the basis of training data.


Find Patent Forward Citations

Baeuerle, Joerg. (2021). Microwave-based measuring device (U.S. Patent No. 11041817). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11041817

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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