The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Feb. 23, 2018
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Alexander Thobe, Stuttgart, DE;

Martin Berger, Pleidelsheim, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01N 21/88 (2006.01); G01B 11/24 (2006.01); H04N 5/225 (2006.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01B 11/24 (2013.01); H04N 5/2252 (2013.01); H04N 5/2253 (2013.01); H04N 5/2256 (2013.01); H04N 5/247 (2013.01); G01N 2021/8829 (2013.01);
Abstract

The quality of objects and workpieces of a manufacturing process is often evaluated based on surface and/or form. An inspection apparatus for optically, in particular deflectometrically, inspecting an object includes a hollow body housing having an opening, the object being positionable in the opening for the inspection; a camera having a plane of focus and a camera direction extending toward the opening of the housing, and being configured to take a plurality of object images of the object situated in the plane of focus; a plurality of light sources arranged around the opening and designed for variably illuminating the plane of focus; and an evaluation unit configured to determine a topography of the object based on the object images.


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