The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 22, 2021

Filed:

Mar. 26, 2019
Applicants:

International Business Machines Corporation, Armonk, NY (US);

Trustees of Princeton University, Princeton, NJ (US);

Inventors:

William Green, Yorktown Heights, NY (US);

Matthias Dittberner, Neustrelit, DE;

Chi Xiong, Yorktown Heights, NY (US);

Eric Zhang, Yorktown Heights, NY (US);

Gerard Wysocki, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01N 21/255 (2013.01); G01N 2201/06113 (2013.01);
Abstract

A generalized feed-forward method for accurate tunable laser absorption spectroscopy includes generating a laser beam. The generated laser beam is directed down a reference path and a test/sample path. One or more parameters are extracted from the reference path. The one or more parameters, extracted from the reference path, are used as feed-forward, to adjust spectral analysis of the test/sample path to detect a composition and/or concentration of an analyte gas within the test/sample path. The extraction of the one or more parameters from the reference path and the spectral analysis of the test/sample path are performed substantially concurrently.


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