The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2021
Filed:
Jul. 12, 2018
Applicant:
Hennyz B.v., Katwijk, NL;
Inventor:
Hendrik Willem Zandbergen, Katwijk, NL;
Assignee:
HennyZ B.V., Katwijk, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/42 (2006.01); H01J 37/18 (2006.01);
U.S. Cl.
CPC ...
G01N 1/42 (2013.01); H01J 37/185 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/20207 (2013.01); H01J 2237/20221 (2013.01); H01J 2237/2802 (2013.01);
Abstract
The present invention is in the field of a cryo transfer system for use in microscopy, and a microscope comprising said system. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy (EM and FIB), and in particular Transmission Electron Microscopy (TEM). However its application is extendable in principle to any field of microscopy, especially wherein a specimen (or sample) is cooled or needs cooling.